Atomic Force Microscope - AFM

The Asylum Research 3D instrumentation consists of a basic unit that includes the atomic force microscope "head," scanner, controller, and anti-vibration system that ensures the stability of the head during scanning. A range of accessories are then present and available for the various analytical techniques that can be implenetated on the instrumentation.

Topographic analysis on solid-phase, organic and inorganic chemical systems exposed to air or present in solution. Possibility to conduct analysis in different modes: "AC mode" and "Contact mode".

1. Additional possible analyses:
   Piezoresponse of materials (Piezoresponse Force Microscopy) in "Single frequency" and "Dark" mode ( Dual Amplitude Resonance Traking)
2. Kelvin Probe Force Microscopy
3. Evaluation of the piezoelectric constant d33 proper to piezoelectric materials

Materials science: nanoscale analysis of surface morphology for massive systems and thin films.