Transmission Electron Microscope - TEM

FEI Tecnai 20

(20kV-200kV continuously adjustable in steps of 10 V over the entire range).

LaB6 filament. (Tungsten (W) filament can also be used in emergency cases).

Twin objective lens.

Computerized goniometer for 5-axis control with very high performance, sample positioning reproducibility. Unlimited number of sample position storage.

Integrated energy dispersive microanalysis (EDS).

EELS spectrometer, for light element analysis detection.

High-resolution digital camera (Gatan Orius), 11 Mpixels.

Integrated STEM HAADF (High Angle Annular dark field) module.

Fully digital microscope equipped with Twin objective lens, which allows a high degree of flexibility to acquire sample information and is ideal for 3D reconstruction.

The HAADF STEM system allows obtaining information related to the atomic mass of the sample and the acquisition of EDX and EELS spectroscopic maps according to an in-line orientation or over a 'well-defined area.

The STEM technique generates high-contrast images in case very thick samples are used.

It allows the analysis of light elements.

Low-Dose software allowing analysis of extremely electron beam sensitive samples, such as biological samples of extremely thin thickness, polymers of different nature and texture, and examinations of Cryo samples.

XPlore 3D is the system exclusively dedicated to the acquisition, alignment and reconstruction of tomograms (in both TEM and STEM modes), fully integrated in the Microscope, with sample displacement along the Z axis of at least ±0.375 mm (total 0.75 mm) including a very large sample tilt,up to ±80°, ideal for 3D reconstruction.

It realizes tomograms after measuring and observing the sample in flat mode.

Biological and Chemical: making measurements on screens of varying thicknesses, without using additional contrast systems.